Electron Microscopy and Nanoanalysis: Scanning Electron Microscopy (SEM)

Do you work in science, industry or research? This course is for everyone who wants to solve analytical problems. Our qualified team provides you with a step-by-step explanation of how to use a scanning electron microscope. After this three-day intensive course, you know how to interpret scanning electron microscopy results, and can undertake tests for material characterisation yourself, e.g. X-ray spectrum analyses.

FELMI-ZFE provides all interested parties from universities and industry with a comprehensive spectrum of the most modern testing methods for microstructural and microchemical material characterisation. The centre’s success is built on its interdisciplinary work, teaching and services provided for industry.

• You gain an overview of the possibilities of scanning electron microscopy and X-ray micro-level analyses of materials.
• You become familiar with the newest developments in electron microscopy for material analysis.
• You learn how to obtain and interpret significant images, spectra and element distribution images.
• You work independently with the most modern scanning electron microscopes.

• Introduction to (E)SEM (theory): Electron sources – lenses, electrons – sample interactions, secondary and back-scattered electron detectors, contrast mechanisms
• Factors influencing image acquisition (microscope)
• Sample preparation
• Introduction to X-ray spectrometry (theory): information depth, inelastic scattering, detectors (wave length and energy dispersive), qualitative – quantitative analyses, element distribution images
• Recording of X-ray spectra and element distribution images (microscope)
• Analysis of samples brought (microscope)
• Further analytical methods (theory): EBSD, variable pressure SEM, Dual Beam (SEM-FIB), transmission electron microscopy, vibrational spectroscopy